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PRODUCT GUIDE
Hercules
®
at a Glance
Semiconductor Plasma Process Sensor
Photovoltaics Plasma Process Sensor
Total Process Control Solution
PLASMA PROCESS CONTROL
Plasma Control Concept
Plasma Metrology
Data Handling
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RF Chamber Matching
Uniformity Improvement
Large Area Uniformity Simulation
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®
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2010 © Plasmetrex GmbH
HERCULES
®
N 250
SENSOR for MEDIUM PRESSURE DEPOSITION
Product:
Hercules
®
N 250
Application:
Quality control
Process development
Product monitoring
Maintenance
Main parameters:
Plasma bulk resistance
Electron collision rate
RF current
Tools:
Medium pressure tools for Plasma Etch and Plasma Enhanced Chemical Vapor Deposition, up to 40.68 MHz generator frequency
Model:
NEED (Non-linear Extended Electron Dynamics) algorithm
Pressure range:
Lower limit: 60 Pa (500 mTorr)
Upper limit: 1 kPa (7.5 Torr)
Chamber setup:
Cylindrical geometry, capacitive coupling
Flexible and small:
4.5 kg
H: 210 mm, D: 250 mm, W: 210 mm
19" rack compatible
Subject to technical alternations!
Hercules
®
PMX 500/1000
Hercules
®
C 500/1000
Hercules
®
N 250
Process Control
Plasma Key Parameters
Hercules
®
Product
Hercules
®
Principle
Hercules
®
Sensors
Main Applications
Hercules
®
Rent-to-buy
Hercules
®
Road Map and History
Data Analysis by HercViewer or HercLotViewer
Data Coupling
Data Management by Hercules
®
Master
Hercules
®
APPLICATION GUIDE
Hercules
®
APPLICATION DATA BASE
Plasma School for Semiconductor Manufacturing
Plasma Technology in Solar Cell Manufacturing
Radio Frequency Technology for Plasma Applications